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CC=Collection Code: [AB2X4]=ANX Form: [cF56]=Pearson: [e d a]=Wyckoff Symbol: [Al2MgO4]=Structure Type:
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CC=27834 Help
TitleApplication of the pattern-fitting structure-refinement method to x-ray powder diffractometer patterns.
AuthorsYoung, R.A.;Mackie, P.E.;von Dreele, R.B.
ReferenceIC&volume=10&fpage=262&details=yes target=icsd_help>Journal of Applied Crystallography (1977) 10, 262-269
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CompoundO2 Si1 - [Quartz low] Silicon oxide [AX2] [hP9] [c a] []
Cell4.9140(4), 4.9140(4), 5.4050(4), 90., 90., 120.
P3221 (154) V=113.03
RemarksR=0.212000 : P =33-1161 : X M =Quartz low :
At least one temperature factor missing in the paper.

Atom (site) Oxid. x, y, z, B, Occupancy
Si1(3a)4
O1(6c)-2
0.4500.6601
0.380.240.7901

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